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Testing of large (high-gain) satellite antennas as well as that of small integrated antennas at millimetre and submillimetre wavelengths is a difficult task. In case of large antennas, the classical far-field method has two major obstacles at mm and submm wavelengths: impractically large measurement distance and high atmospheric loss.The planar near-field scanning method has been used up to 1 THz. The applied near-field methods give useful information only on the main beam and its vicinity, because the field-sampling is typically very sparse.

Reflector-based compact antenna test range (CATR) measurements have been carried out up to 500 GHz. Hologram-based CATR measurements have been carried out at 650 GHz. In case of small integrated antennas, various techniques for on-wafer measurements have been developed. This short course discusses the techniques and limitations of the various test methods, such as the planar near-field scanning and CATR as well as on-wafer measurements. Also antenna pattern correction techniques are discussed. Lectures are accompanied by laboratory demonstrations/exercises.

The participants have a choice to study a related specific topic prior to the short course, write a brief report and present that to other participants during the course. The lectures include the following: introduction, mm- and submm-wave instrumentation, near-field scanning, near-field to far-field transformation, compact antenna test range (CATR), CATR based on reflectors, a lens, or a hologram, construction of a hologram based CATR, quiet-zone testing and antenna testing in a CATR, antenna pattern correction techniques, testing of small integrated antennas.

The laboratory demonstrations (exercises) include the following:
- vector measurements at 1THz
- scanning of near-field – computation of the far-field pattern
- antenna measurement in a hologram CATR
- elimination of disturbing scatterer effect in a CATR – application of the APC method
- on-wafer antenna measurement through reflection coefficient measurement

Important details

Course duration: 30.5 hours

Course credit information: the course gives 2 (-4) ECTS credits

Prerequisites: basics of antennas and microwaves, basic knowledge of electromagnetics and mathematics

Capacity: 25 students

Registration: Please, download the registration form found below and send it back to the organizers before April 16th, 2019.

Registration fee: 440 € for a full time university student and 1100 € for others

Student grant information: Some grants in the form of the registration fee waiver will be available. For more details and the application form, please, download the form. The deadline for student grant application is April 16th, 2019.

How to reach: The course will be located in the Aalto University School of Electrical Engineering, Dept. of Electronics and Nanoengineering Maarintie 8, Espoo, Finland.

Accommodation:
Accommodation is not included in the course fee. Details of how to book accommodation can be found in web "hotels in Helsinki/Espoo".

Further Information:
To receive further information, please, contact Antti Räisänen/Juha Ala-Laurinaho (see contact information in the registration form).

Responsibles:  Antti Räisänen and Juha Ala-Laurinaho

Organizers and sponsors: Aalto University,UPM, ASYSOL, Virginia Diodes, European Microwave Association EuMA/EuCoM, EurAAP, Dassault Systèmes Simulia