New HR-TEM installation in progress in Nanomicroscopy Center
New high throughput nano-analysis TEM is planned to be operational during Jan 2016
A JEOL JEM-2800 high-throughput, high-resolution TEM system is currently being installed to Nanomicroscopy Center.
This versatile TEM features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS) for chemical analysis; TEM/STEM tomography; and in situ observation of samples.
The JEM-2800 functions without the use of fluorescent screen. It is operated in a bright room.
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Researcher-established company Xiphera growing rapidly
Xiphera Oy, which is celebrating its ninth anniversary, has developed hardware-based encryption solutions for the prevention of information security threats. The company is a deep tech company and its products are based on research and produce new technological solutions.
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A Finnish working group’s artwork brings a cooling garden to Spain, which is sweltering in the heat
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